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Film thickness measurement system "FilmSmart"

A system that is rich in options such as spectrometers, light sources, and stages, and is compact, lightweight, and inexpensive.

"FilmSmart" is a film thickness measurement system from HMTEK (Taiwan) that can measure film thickness, refractive index n/attenuation coefficient k, transmission/reflection rates, and color. It is an integrated system with a CCD spectrometer, light source, stage, fiber optic coupling system, computer, and software, requiring no complicated tasks or settings, allowing for easy surface and thin film measurements. 【Features】 ■ Measurement range: 200A to 400,000A ■ Wavelength range: 380-850nm ■ Capable of measuring refractive index n, attenuation coefficient k, transmission, reflection, and color ■ Compact and lightweight with easy measurement using the included software ■ Automatic XY stage: 2D and 3D plotting (optional) *For more details, please download the PDF or feel free to contact us.

  • Coating thickness gauge

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